Dresden 2014 – wissenschaftliches Programm

Bereiche | Tage | Auswahl | Suche | Aktualisierungen | Downloads | Hilfe

MA: Fachverband Magnetismus

MA 19: Poster I

MA 19.43: Poster

Dienstag, 1. April 2014, 13:00–15:30, P1

quantitative magnetic imaging at the nanometer scale by ballistic electron magnetic microscopy — •hervé marie^1,2, sylvain tricot¹, sophie guézo¹, gabriel delhaye¹, bruno lépine¹, philippe schieffer¹, and pascal turban¹ — ¹Département Matériaux-Nanosciences - Institut de Physique de Rennes, Rennes, France — ²Physikalisches Institut, Karlsruhe Institute of Technology (KIT),Karlsruhe, Germany

Ballistic Electron Magnetic Microscopy (BEMM) is a unique experimental tool allowing characterization of electronic properties of buried interfaces with nanometric lateral resolution. In BEMM experiments, hot electrons are injected from an STM tip into a spin-valve/semiconductor heterostructure. The hot electron current collected at the back of the substrate is modulated by magnetoresistive effects.

We report in this communication an investigation of sub-micrometric spin valves Fe/Au/Fe/GaAs with an Fe electrode evaporated through a nanostencil. In these structures, the modulation of the collected current by the local magnetic domain structure in the Fe dots allows magnetic imaging of buried nanostructures with strong contrast (500%) and a nanometric lateral resolution. The experimental magnetocontrast observed on these sub-micrometric Fe dots are in excellent agreement with BEEM current maps calculated via micromagnetic simulations. This opens the way to a quantitative magnetic microscopy technique with a high sensitivity and a nanometric lateral resolution [1].

[1] M. Hervé et al., J. Appl. Phys. 113, 233909 (2013)