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MM: Fachverband Metall- und Materialphysik
MM 31: Mechanical properties II - Characterisation mechanics
MM 31.3: Talk
Tuesday, April 1, 2014, 16:15–16:30, IFW D
Ambiguity filtering for quantitative data analysis of ACOM-TEM imaging of nanocrystalline metals — •Aaron Kobler1,2, Edgar Rauch3, Christian Kübel1, and Horst Hahn1,2 — 1Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany — 2Technische Universität Darmstadt (TUD), Darmstadt, Germany — 3SIMAP laboratory, Saint Martin d'Hères Cedex, France
Automatic Crystal Orientation Mapping for the Transmission Electron Microscope (ACOM-TEM) still is a new technique. It allows investigating nanocrystalline (nc) metals with crystal sizes <100 nm where Electron Backscattering Diffraction reaches its limitations. Recently, we combined ACOM-TEM (Nanomegas) imaging with in-situ straining inside the TEM using Hysitron's TEM Picoindenter to follow up the deformation processes of nc PdAu alloys. After recognizing grains/crystallites in crystal orientation maps using Mtex we tracked individual crystallites through straining series. This allowed us to separate grain rotation from an overall sample bending. However, this tracking fails if the grain recognition is misled by the famous 180° ambiguity of the crystal orientation data. 180° ambiguity arises for certain crystal orientations if the underlying spot diffraction pattern show only a limited number of diffraction spots from the zero order Laue zone. As a result of it twin noise is visible. This kind of noise leads to failure of the crystallite tracking and a reduced reliability of quantitative data analysis. Here we present a simple approach to correct for this ambiguity, further some results on in-situ straining of nc PdAu using this filter.