Dresden 2014 – scientific programme
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MM: Fachverband Metall- und Materialphysik
MM 58: Topical session: X-ray and neutron scattering in materials science III - Real-time insights into fast heat treatment processes using diffraction methods
MM 58.4: Talk
Thursday, April 3, 2014, 16:45–17:00, BAR 205
In situ high energy X-ray diffraction for analyzing the local stress distribution and microstructure in the chip formation zone during orthogonal cutting of steel C45E — •Katrin Brömmelhoff1, Steffen Henze2, Robert Gerstenberger2, Torben Fischer3, Norbert Schell3, Eckart Uhlmann2, and Walter Reimers1 — 1TU Berlin, Materials Science and Technology-Metallic Materials, Ernst-Reuter-Platz 1, 10587 Berlin, Germany — 2TU Berlin, IWF, Pascalstr. 8-9, 10587 Berlin, Germany — 3Helmholtz-Zentrum Geesthacht, Max-Planck-Str. 1, 21502 Geesthacht, Germany
The stress distribution in the chip formation zone during cutting is an asked question in the field of manufacturing technology and is required for a fundamental understanding of the chip formation process. New synchrotron facilities with high photon flux provide the opportunity to measure the local strains with a high spatial resolution. Therefore, the steep stress gradients in the chip formation zone can be analyzed. Performing in situ high energy synchrotron X-ray diffraction during orthogonal cutting at the HEMS beamline (PETRA III/Hamburg), the beam size and therefore the measuring positions could be reduced to 0.02 mm x 0.02 mm. The stress distribution exhibits steep stress gradients and shows significant dependencies on the cutting parameters and a strong change of the microstructure was observed, namely a reduction of domain sizes and the development of a shear texture. The results of these in situ experiments serve to evaluate and extend existing chip formation models and will be used for the optimization of FEM (Finite Element Method) cutting simulations.