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MM: Fachverband Metall- und Materialphysik
MM 62: Topical session: X-ray and neutron scattering in materials science IV - High Energy Single Grain Diffraction
MM 62.4: Talk
Thursday, April 3, 2014, 18:30–18:45, BAR 205
Strain profile of magnetoelectric interfaces studied by X-ray diffraction methods — •Madjid Abes1, Christian Koops1, Stjepan Hrkac1, Adrian Petraru2, Hermann Kohlstedt2, Bridget Murphy1, and Olaf Magnussen1 — 1Institut für experimentelle und angewandte Physik, CAU Kiel, Germany — 2Institute of Electrical and Information Engineering Nanoelectronic, CAU Kiel, Germany
Understanding the coupling at the interface between piezoelectric (PE) and magnetostrictive (MS) components in magnetoelectric (ME) composites is essential for the optimization of these composites for sensor applications. A large ME response is only obtained if the lattice deformation induced by an external magnetic field in the MS material can be transferred efficiently to the PE material. To study the coupling at the buried ME composite interface we measured the lattice deformation in PbZr0.52Ti0.48O3 (PZT)/ CoFe2O4 (CFO) composites. These in situ grazing incidence [1] and high resolution X-ray diffraction were carried out in an applied magnetic or electric field. Surprisingly, the coupling between the components is not perfect for these epitaxial composite systems. We attribute to this to additional strain relaxation at grain boundaries reducing the strain transfer at the interface between the crystal lattices of both components. The authors thank the DFG SFB 855 for financial support.
[1] M. Abes et al., Appl. Phys. Lett., 102, 011601 (2013)