Dresden 2014 – wissenschaftliches Programm

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O: Fachverband Oberflächenphysik

O 63: Posters: Scanning Probe Methods

O 63.31: Poster

Mittwoch, 2. April 2014, 17:30–21:00, P2

New PEEM and NEXAFS/EXAFS experiments at the synchrotron source DELTA: Ready for user — •Christoph Keutner, Ulf Berges, Dominique Handschak, and Carsten Westphal — DELTA/Experimentelle Physik I, TU Dortmund, Maria-Goeppert-Mayer-Straße 2, 44221 Dortmund, Germany

We report on the setups of two new experiments at the PGM undulator beamline 11 (30 eV - 1000 eV) of Dortmund’s synchrotron source DELTA.

The first experiment is a photoemission electron microscope (PEEM), which uses electrons emitted from an illuminated sample to generate a spatially resolved image of its surface. PEEM can be used for spatially resolved x-ray absorption spectroscopy (XAS) by scanning the photon energy and recording individual images within the sequence. Here, a Staib PEEM 350-20 with a spatial resolution of up to 220 nm is used. In combination with our self-developed S.P.A.M.M. software it enables a fully automatized data acquisition (image-squences and beamline flux) for XAS. The experimenter just has to specify basic parameters - e.g. energy range and step width.

The second setup is an extension to the existing XPS/XPD-machine. By using our NEMeSUS software it is now possible to preform near-edge x-ray absorption fine structure (NEXAFS) and extended X-ray absorption fine structure (EXAFS) by using the total electron yield (TEY). Hence, a combination of highly surface sensitive XPS/XPD with deeper reaching NEXAFS/EXAFS-techniques in the identical geometric setup can be realized.