Dresden 2014 – wissenschaftliches Programm

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O: Fachverband Oberflächenphysik

O 73: Scanning Probe Methods II

O 73.6: Vortrag

Donnerstag, 3. April 2014, 11:45–12:00, WIL A317

Multi-Tip STM / Nanoprober for electrical characterization at the nanoscale — •Bert Voigtländer, Vasily Cherepanov, Peter Coenen, Stefan Korte, Marcus Blab, and Hubertus Junker — Peter Grünberg Institut (PGI-3), Forschungszentrum Jülich, 52425 Jülich, Germany, and JARA-Fundamentals of Future Information Technology

We present design and performance of an ultra compact four tip STM which integrates four independent STM units within a diameter of 50 mm resulting in a mechanical stability which enables atomic resolution imaging with each tip. The heart of this STM is a new type of piezoelectric coarse approach called KoalaDrive. The coarse positioning of the tips is done under the control of an SEM. This multi-tip instrument offers the capability to perform current and voltage measurements at the nanoscale. Due to its small size this instrument is ideally suited for integration into a cryostat. The control electronics allows each tip to be used as current probe or voltage probe. The software allows virtually any possible "concerted" spectroscopic measurements involving the four tips and the sample. We demonstrate the potential of the instrument to perform charge transport measurements at the nanoscale by various examples: Resistance/dopant profiling at freestanding GaAs nanowires, distance dependent four point measurements at Si surfaces, and gate dependent charge transport measurements on graphene.