DPG Phi
Verhandlungen
Verhandlungen
DPG

Dresden 2014 – scientific programme

Parts | Days | Selection | Search | Updates | Downloads | Help

O: Fachverband Oberflächenphysik

O 73: Scanning Probe Methods II

Thursday, April 3, 2014, 10:30–13:15, WIL A317

10:30 O 73.1 Friction contrast in Dynamic Friction Force Microscopy — •Felix Mertens, Thomas Göddenhenrich, and André Schirmeisen
10:45 O 73.2 Artifacts in combined STM/AFM due to non-ideal ground in an STM pre-amplifier — •Nirmalesh Kumar Sampath Kumar, Alfred John Weymouth, and Franz Josef Giessibl
11:00 O 73.3 Dynamic local work function measurement and the role of topography — •Ferdinand Huber, Sonia Matencio, Alfred J. Weymouth, and Franz J. Giessibl
11:15 O 73.4 The STM as Microwave resonator: Josephson currents interacting with the environment — •Berthold Jäck, Matthias Eltschka, Maximilian Assig, Markus Etzkorn, Christian R. Ast, and Klaus Kern
11:30 O 73.5 The Zeeman Effect in dimensionally confined, superconducting STM tips — •C. R. Ast, M. Eltschka, B. Jäck, M. Assig, M. Etzkorn, O. V. Kondrashov, M. A. Skvortsov, and K. Kern
11:45 O 73.6 Multi-Tip STM / Nanoprober for electrical characterization at the nanoscale — •Bert Voigtländer, Vasily Cherepanov, Peter Coenen, Stefan Korte, Marcus Blab, and Hubertus Junker
12:00 O 73.7 Atomically resolved STM imaging with a single-crystal diamond tipVladimir I. Grushko, •Olaf Lübben, Alexander N. Chaika, Nikolay V. Novikov, Evgeniy I. Mitskevich, A. P. Chepugov, Oleg G. Lysenko, Barry E. Murphy, Sergey A. Krasnikov, and Igor V. Shvets
12:15 O 73.8 STM imaging of HOPG: Tip geometry effects — •Gábor Mándi, Gilberto Teobaldi, and Krisztián Palotás
12:30 O 73.9 A new low temperature near-field optical scanning microscope — •Julia Janik, Claudio Dal Savio, and Achim Hartschuh
12:45 O 73.10 Secondary Electron Analysis with Topografiner Technology — •Lorenzo G. De Pietro, Danilo A. Zanin, Hugo Cabrera, Mehmet Erbudak, Andreas Fognini, Thomas U. Michlmayr, Yves M. Acremann, Danilo Pescia, and Urs Ramsperger
13:00 O 73.11 High-Resolution Imaging and nano-FTIR Spectroscopy using Synchrotron Radiation at the Metrology Light Source — •Peter Hermann, Arne Hoehl, Piotr Patoka, Bernd Kästner, Georg Ulrich, Eckart Rühl, Burkhard Beckhoff, and Gerhard Ulm
100% | Mobile Layout | Deutsche Version | Contact/Imprint/Privacy
DPG-Physik > DPG-Verhandlungen > 2014 > Dresden