Dresden 2014 – wissenschaftliches Programm

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O: Fachverband Oberflächenphysik

O 99: Scanning Probe Methods III

O 99.5: Vortrag

Freitag, 4. April 2014, 11:30–11:45, GER 38

Scanning force and Kelvin probe force microscopy studies of vicinal Si(111) with atomic resolution — •Carmen Pérez León, Holger Drees, Michael Marz, and Regina Hoffmann-Vogel — Karlsruher Institut für Technologie (KIT), Physikalisches Institut and DFG-Center for Functional Nanostructures (CFN), D-76131 Karlsruhe

Stepped well-ordered surfaces can be used as nanotemplates for the fabrication of one-dimensional nanostructures. Vicinal Si(111) surfaces inclined towards the [112] direction contain steps with the height of one and three interplanar distances at temperatures below 870^∘C [1]. With increasing miscut angle the amount of triple steps also increases [1,2]. For an angle of 10 ^∘, only triple steps appear between regularly spaced (111) terraces with a width equal to that of a cell of the Si(111)-7×7 surface structure [2]. We have investigated the atomic structure of the 10 ^∘-miscut vicinal Si(111) surface with with frequency-modulation scanning force microscopy (FM-SFM) and Kelvin probe force microscopy (KPFM) at room temperature. Although measurements of step edges are challenging for SFM and KPFM, we have obtained atomic resolution of the structure and the surface potential distribution on the triple step between the Si(111)-7×7 terraces.

[1] S. A. Teys, K. N. Romanyuk, R. Zhachuk and B. Z. Olshanetsky, Surf. Sci. 600, 4878 (2006).

[2] A. Kirakosian, R. Bennewitz, J. N. Crain, Th. Fauster, J.-L. Lin, D. Y. Petrovykh and F. J. Himpsel, Appl. Phys. Lett. 79, 1608 (2001).