Berlin 2015 – wissenschaftliches Programm

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DS: Fachverband Dünne Schichten

DS 20: Focussed Session: In-situ optical spectroscopy

DS 20.1: Hauptvortrag

Mittwoch, 18. März 2015, 09:30–10:00, H 0111

Differential Optical Spectroscopy for Surface Science — •Peter Zeppenfeld — Institut für Experimentalphysik, Johannes Kepler Universität Linz, Austria

Conceptually very simple optical methods, namely Reflectance Difference Spectroscopy (RDS/RAS) and Differential Reflectance Spectroscopy (DRS), can provide valuable insight into the structure and growth of ultrathin films in straight correlation with their electronic, optical and other physical or chemical properties. Notably, differential optical spectroscopies can achieve sub-monolayer sensitivity and are capable of monitoring kinetic processes on surfaces in real time. This will be illustrated in selected examples dealing with the fabrication and optical characterization of functional layers, such as reconstructed surfaces [1,2], graphene nanoribbons [3], and ultrathin molecular films [4,5]. While the spatial resolution in the UV-VIS range is naturally limited, microscopic information on the structure and electronic properties can be obtained with complementary surface science techniques such as STM and Photoemission Electron Microscopy (PEEM). As an outlook, I will describe how optical spectroscopy and PEEM can be combined into a single experiment, thus enabling truly parallel optical and photoelectron spectroscopy at a local scale.

[1] L.D. Sun et al., Phys. Rev. B 69, 045407 (2004)

[2] M. Bachmann et al., Appl. Surf. Sci. 258, 10123 (2012)

[3] R. Denk et al., Nat. Commun. 5:4253 (2014)

[4] L.D. Sun et al., Phys. Chem. Chem. Phys. 14, 13651 (2012)

[5] L.D. Sun et al., Phys. Rev. Lett. 110, 106101 (2013)

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