Berlin 2015 – wissenschaftliches Programm
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DS: Fachverband Dünne Schichten
DS 3: Organic Thin Films
DS 3.12: Vortrag
Montag, 16. März 2015, 18:30–18:45, H 2032
Fast IR laser mapping ellipsometry for the study of functional organic thin films — •Andreas Furchner1, Guoguang Sun1, Helge Ketelsen2, Jörg Rappich3, and Karsten Hinrichs1 — 1Leibniz-Institut für Analytische Wissenschaften – ISAS – e. V., Schwarzschildstraße 8, 12489 Berlin, Germany — 2SENTECH Instruments GmbH, Schwarzschildstraße 2, 12489 Berlin, Germany — 3Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Institut für Silizium-Photovoltaik, Kekuléstraße 5, 12489 Berlin, Germany
The infrared spectral range provides information about the structural and chemical properties of functional organic thin films. The need to characterize these properties with high lateral resolution in short measurements times requires a new generation of infrared ellipsometer. A novel laboratoy-based infrared laser mapping ellipsometer is presented that allows for measurements with lateral resolutions of 0.12 mm and time resolutions down to 80 ms per spot. The ellipsometer is applied for the optical characteriztion of inhomogeneous poly(3-hexylthiophene) and poly(N-isopropylacrylamide) organic thin films used for opto-electronics and bioapplications.