Berlin 2015 – wissenschaftliches Programm

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DS: Fachverband Dünne Schichten

DS 3: Organic Thin Films

DS 3.13: Vortrag

Montag, 16. März 2015, 18:45–19:00, H 2032

Characterization of advanced biomaterials for the medical device industry using Synchrotron Radiation-based FTIR microspectroscopy and X-Ray spectroscopic techniques — •Andrea Hornemann¹, Beatrix Pollakowski¹, Bonnie Tyler², Gerald Holzlechner³, Anna Belu⁴, Arne Hoehl¹, and Burkhard Beckhoff¹ — ¹Physikalisch-Technische Bundesanstalt, Berlin, Germany — ²National Physics Laboratory, London, United Kingdom — ³BAM Federal Institute of Materials Research and -Testing, Berlin, Germany — ⁴Medtronic, Minneapolis, U.S.A.

Since its early development implantable medical devices had tremendous impact on the quality of life. But still today many implants cause inflammations due to incompatibility with human tissues or due to device related infections. Hence, there is a need for exploring new advanced biomaterials that comprise thin film coatings, surface grafted biomolecules, nanoparticle coatings, drug-eluting films, and especially bioresorbable components. Reliable metrological tools for the rapid characterization of medical devices are essential to probe their physicochemical properties. Both vacuum-based and ambient techniques, represented here by X-ray and FTIR spectroscopic techniques, allow for a characterization of surface layers, contaminants on the surface of medical devices in the manufacturing environment, and enable the detection of defects and chemical constituents in the near-surface region. The measurement sequences exhibit the potential of the use of orthogonal methods as FTIR and X-ray spectrometry to significantly contribute to the traceable and reliable characterization of medical devices.