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DS: Fachverband Dünne Schichten
DS 36: Poster Session I
DS 36.30: Poster
Thursday, March 19, 2015, 09:30–12:00, Poster A
Electric characterization of single crystalline and polycrystalline CZTS films and bulk material — •Martin Handwerg1,2, Rüdiger Mitdank1, Justus Just2, Segej Levcenco2, Thomas Unold2, and and Saskia F. Fischer1 — 1AG Neue Materialien, Humboldt-Universität zu Berlin, 10099 Berlin, Germany — 2Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, 14109 Berlin, Germany
Copper Zinc Tin Sulfide (CZTS) is investigated as absorption layer for solar cells to increase their efficiency.
Because of the large number of stoichiometric combinations, detailed and systematic investigations of the electric and thermal transport properties need to be carried out and correlated to the structure and composition.
Here, the temperature dependence of the resistivity of polycrystalline films with different composition from high copper (2.29 nCu/nZn+Sn) to low copper amount (0.47 nCu/nZn+Sn) is measured out using the van-der-Pauw method.
Resistance and Hall measurements were performed on CZTS single crystals as well.
All measurements were performed between 4.2 K and 300 K.
The measured electric conductivity values can be compared to reported measurements [1] and discussed in relation to their stoichiometric compound.
[1] Wu Xinkun et al.,2012, J. Semicond., 33(2)