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DS: Fachverband Dünne Schichten
DS 39: Poster Session II
DS 39.21: Poster
Thursday, March 19, 2015, 16:00–18:30, Poster F
Characterization of surface contaminants of medical devices by means of Synchrotron Radiation-based FTIR microspectroscopy and X-Ray spectrometry — Beatrix Pollakowski1, •Andrea Hornemann1, Bonnie Tyler2, Rory Steven2, Peggy Emmer1, and Burkhard Beckhoff1 — 1Physikalisch-Technische Bundesanstalt, Berlin, Germany — 2National Physics Laboratory, London, United Kingdom
It is an emerging topic to develop metrology tools for a traceable characterization of advance biomaterials for the medical device industry. One aspect concerns the detection and identification of defect structures and contaminants, which may lead to delamination, cracking and spalling of the coating and ultimately lead to the device failure. This work deals with analysis of contaminants dedicatedly deposited on relevant substrates. Bis-steramide is a surface contamination originating from the production and packing process. Employing both vacuum-based and ambient techniques, represented here by X-ray fluorescence analysis under grazing incidence condition (GIXRF) and FTIR spectroscopic techniques, it allows for a traceable and reliable analysis of mass deposition and the chemical species of the contaminants. The combination of GIXRF and XAFS offers a non-destructive access to depth-resolving analysis with respect to both, the chemical speciation and the depth-dependent elemental composition. The results on different bis-steramide samples with varying layer thicknesses show that the combination of complementary methods substantially supports the development of a metrology for complex biomaterial for medical devices.