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MA: Fachverband Magnetismus

MA 19: POSTER Ia

MA 19.64: Poster

Dienstag, 17. März 2015, 09:30–13:00, Poster A

In-situ Polarised Neutron Reflectometry during Thin Film Growth by DC Magnetron SputteringSina Mayr1, Wolfgang Kreuzpaintner1, Birgit Wiedemann1, •Jingfan Ye1, Andreas Schmehl2, Thomas Mairoser2, Alexander Herrnberger2, Jean-Francois Moulin3, Jochen Stahn4, Panagiotis Korelis4, Martin Haese-Seiller3, Matthias Pomm3, Amitesh Paul1, Peter Böni1, and Jochen Mannhart51Technische Universität München, Garching — 2Zentrum für elektronische Korrelation und Magnetismus, Universität Augsburg — 3Helmholtz Zentrum Geesthacht, Instrument REFSANS, Garching — 4Paul Scherrer Institut, Villigen PSI, Schweiz — 5Max Planck Institut für Festkörperforschung, Stuttgart

Since thin magnetic layers are used in many magneto-electronic devices the understanding of their texture and the coupling between them is essential to improve functionality. As these parameters are likely to change during the deposition process, in-situ polarised neutron reflectometry (PNR) is used to monitor the development of the structural and magnetic thin film properties during growth. We carry out in-situ PNR measurements using a specially designed sputtering chamber as sample environment combined with modern neutron optical elements at AMOR at PSI. In this contribution, the epitaxial growth of Fe and Cr on a Cu(100)/Si(100) substrate and the evolution of the magnetic properties, particularly the exchange coupling effects in a Fe/Cr heterostructure as a function of film thickness will be presented.

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DPG-Physik > DPG-Verhandlungen > 2015 > Berlin