Berlin 2015 – wissenschaftliches Programm
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MM: Fachverband Metall- und Materialphysik
MM 13: Microstructure and Phase Transformations III
MM 13.2: Vortrag
Montag, 16. März 2015, 16:00–16:15, H 0106
Illuminating Correlative Research using X-ray and Electron Microscopy — •Lars-Oliver Kautschor1, Arno P. Merkle2, Jeff Gelb2, and Lorenz Lechner2 — 1Carl Zeiss Microscopy GmbH, Oberkochen, Germany — 2Carl Zeiss X-ray Microscopy, Inc., Pleasanton, CA USA
X-ray tomography has emerged as a new powerful imaging technique that obtains 3D structural information from opaque samples under a variety of conditions and environments. It has rapidly become an accepted laboratory technique offering quantitative information in the materials sciences. We present ways in which non-destructive 3D volumetric information, obtained via laboratory nanoscale and sub-micron X-ray microscopy (XRM) are increasingly used to probe scientific questions as a complement to Electron- and Light-based microscopy methods. These correlative methods, relating to XRM, provide an opportunity to study materials evolution at multiple length scales in 3D and utilize this information to inform or guide postmortem analysis to be most efficient.
In materials research, the motivation to correlate XRM information with postmortem EM stems from different primary reasons. XRM is used as a 3D navigation system ("Google Earth" in 3D) for targeting and finding specific buried structures of interest for extraction or cross sectional imaging. We demonstrate several examples, including energy materials, automotive applications and metals, upon which the use of XRM and FIB/SEM information on the same specimen has contributed to a more complete understanding of a materials system.