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O: Fachverband Oberflächenphysik
O 37: Scanning Probe Techniques
O 37.14: Poster
Tuesday, March 17, 2015, 18:15–21:00, Poster A
Influence of higher flexural modes in piezoresponse force microscopy — •Valon Lushta1, Thomas Göddenhenrich1, Bernhard Roling2, and André Schirmeisen1 — 1Institut für Angewandte Physik, Justus-Liebig-Universität Gießen, D-35392 Gießen — 2Physikalische Chemie,Philipps-MarburgUniversität Marburg, D-35032 Marburg
Piezoresponse force microscopy, based on contact resonance of the cantilever, is a useful tool for probing the local piezoelectric properties on ferroelectric materials. Dual AC resonance tracking and band excitation techniques have been used to investigate the local deformation and polarization of ferroelectric domains. Measurements are performed at different flexural eigenmodes of the cantilever. The results of local amplitude and phase hysteresis loops reveal, that an excitation of higher flexural modes is less sensitive to a parasitic non localized capacitive force contribution between cantilever and sample surface.