Berlin 2015 – scientific programme
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O: Fachverband Oberflächenphysik
O 37: Scanning Probe Techniques
O 37.8: Poster
Tuesday, March 17, 2015, 18:15–21:00, Poster A
Bidirectional quantitative force gradient microscopy sensors — •Christopher F. Reiche1, Julia Körner1, Silvia Vock1, Volker Neu1, Bernd Büchner1,2, and Thomas Mühl1 — 1Leibniz-Institut für Festkörper- und Werkstoffforschung IFW Dresden — 2Institut für Festkörperphysik, Technische Universität Dresden
Dynamic scanning force microscopy (dSFM) is a versatile high spatial resolution method to study force-related surface properties of many different samples. We present our new approach of bidirectional force gradient microscopy, that includes lateral force microscopy and is compatible with usual dSFM equipment. We also provide methods for the quantitative evaluation of the force gradient data gathered with such a sensor. Furthermore, we discuss a novel approach to greatly enhance the dSFM sensor's sensitivity while still using conventional cantilever deflection detection. This signal amplification concept may also be adapted to many other oscillation based micro- and nanosystems and methods. Finally, we apply this concept to our magnetic force microscopy probes equipped with wear-resistant iron filled carbon nanotube tips, whose monopole-like stray field characteristics make them ideal for easy and reproducible quantitative field gradient measurements [1,2].
[1] F. Wolny, T. Mühl, U. Weissker, K. Lipert, J. Schumann, A. Leonhardt, and B. Büchner, Nanotechnology 21, 435501 (2010)
[2] T. Mühl, J. Körner, S. Philippi, C. F. Reiche, A. Leonhardt, and B. Büchner, Appl. Phys. Lett. 101, 112401 (2012)