Berlin 2015 – wissenschaftliches Programm
O 87.13: Vortrag
Donnerstag, 19. März 2015, 18:00–18:15, MA 041
Ab initio calculation of XNLD in reflection of graphene — •Dominik Legut1, Peter M. Oppeneer2, Christine Jansing3, Marc F. Tesch3,4, Markus Gilbert3, Andreas Gaupp3, Hans-Christoph Mertins3, Andrey Sokolov4, Suk-Ho Choi5, Hud Wahab6, Heiko Timmers6, and R.G. Elliman7 — 1IT4Innovations Centre, VSB-TU Ostrava, Ostrava, Czech Republic — 2Department of Physics and Astronomy, Uppsala, Sweden — 3FH Münster, Steinfurt, Germany — 4HZB, Berlin, Germany — 5Department of Applied Physics, Kyung Hee University, Korea — 6University of New South Wales Canberra, Canberra BC, Australia — 7Department of Elect. Mat. Eng., Australian National University, Canberra, Australia
The reflection spectroscopy and in particular angular dependence of the x-ray natural linear dichroism (XNLD) were calculated on free standing monolayered graphene. The anisotropic XNLD was computed in the single electron picture within the framework of the DFT. The excitations stemming from carbon K-edge are considered. The spectral shape of the XNLD is compared with recorded data. The dependence of the reflection spectroscopy, here XNLD, based on the change of the electronic structure of bi-layer and tri-layered graphene is predicted.