Berlin 2015 – wissenschaftliches Programm

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TT: Fachverband Tiefe Temperaturen

TT 21: Superconductivity: Poster Session

TT 21.39: Poster

Montag, 16. März 2015, 15:00–18:00, Poster B

Measurement setup for the magnetic penetration depth and superfluid stiffness in thin superconducting films. — •Lorenz Fuchs1, Markus-Christopher-Paul Brunner1, Jessica Bousquet2, Ina Schneider1, Klaus Kronfeldner1, Etienne Bustarret2, and Christoph Strunk11Institute for exp. and appl. Physics, University of Regensburg, Germany — 2Institut NÉEL, Grenoble, France

A mutual inductance measurement setup has been established in order to determine the magnetic penetration depths of thin film superconductors. [1] By measuring the variation of the mutual inductance M, the temperature dependent penetration depth can be evaluated. [2] The setup has been characterized using thin aluminum and niobium films as a reference. Temperature dependence of λ of B-doped diamond films is determined down to 0.3K and compared with theoretical expectations. [3] The impact of the doping ratio B/C and film thickness on λ and Tc is investigated. Correlation between the film impedance σ = σ1i σ2 and λ is examined.

[1] A.T. Fiory et al., Appl. Phys. Lett. 52 (25), 1988

[2] T. Lemberger et al., J. Appl. Phys. 83 (8), 1998

[3] E. Bustarret et al., Phil. Trans. R. Soc. A, 2008

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