Berlin 2015 – wissenschaftliches Programm
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TT: Fachverband Tiefe Temperaturen
TT 80: 2D Materials Beyond Graphene: TMDCs, Silicene and Relatives (organized by O)
TT 80.9: Vortrag
Mittwoch, 18. März 2015, 17:15–17:30, MA 005
Near-field microscopy and nano-FTIR spectroscopy on monolayer MoS2 grown on periodically poled LiNbO3 — •Georg Ulrich1, Piotr Patoka1, Peter Hermann2, Bernd Kästner2, Ariana Nguyen3, Tom Scott4, Arne Hoehl2, Ludwig Bartels3, Peter Dowben4, Gerhard Ulm2, and Eckart Rühl1 — 1Physikalische Chemie, Freie Universität Berlin, Takustr. 3, 14195 Berlin, Germany — 2Physikalisch-Technische Bundesanstalt (PTB), Abbestr. 2-12, Berlin, 10587 Berlin, Germany — 3Department of Chemistry, U California Riverside, Riverside, CA 92521, USA — 4Department of Physics and Astronomy, U Nebraska, Lincoln, NE 68588-0299 USA
Coupling of synchrotron radiation from the Metrology Light Source to a scanning near-field optical microscope (SNOM) has emerged as a possibility for highly sensitive spectroscopic investigations in the mid-infrared regime [1]. It also allows the simultaneous collection of topographic information and optical response from the samples with a spatial resolution below 30 nm. Here we will present the results of nano-FTIR spectroscopy and near-field imaging of monolayer MoS2 islands on a periodically poled lithium niobate (PPLN) sample using synchrotron radiation in the infrared regime and tunable CO2 laser radiation, respectively. The results show the influence of the ferroelectric polarization of the PPLN structure on the MoS2 semiconductor which enhances the surface polarization of the ferroelectric domains only in one direction. [1] P. Hermann et al., Opt. Express 22, 17948 (2014)