Heidelberg 2015 – wissenschaftliches Programm
A 26.1: Poster
Mittwoch, 25. März 2015, 17:00–19:00, C/Foyer
Energy-dependent electron impact induced fluorescence relative cross-sections of neon — •Catmarna Küstner-Wetekam, Philipp Schmidt, Andreas Hans, Christian Ozga, André Knie, and Arno Ehresmann — Institut für Physik and Center for Interdisciplinary Nanostructure Science and Technology, Universität Kassel, Heinrich-Plett-Straße 40, 34132 Kassel, Germany
Electron impact induced ionization cross-sections of rare gases are needed in astrophysics and as benchmarks for theoretical calculations. Electron impact induced fluorescence spectroscopy (EIFS) has been used to determine relative partial fluorescence emission cross-sections of neon within the fluorescence wavelength range between 190 nm and 210 nm. The excitation energy was varied between 0.3 keV and 3.5 keV. The used experimental EIFS-setup  is shown and explained. Observed lines are assigned to transitions within NeII and NeIII and the results of the energy-dependent measurements are compared with published cross-sections [2,3] .
 A. Knie et al., J. Elec. Spec. Relat. Phenom., 185, 492-497 (2012)
 D. P. Almeida et al., J. Phys. B., 28, 3335-3345 (1995)
 B. L. Schram et al., Physica, 32, 185-196 (1966)