Bereiche | Tage | Auswahl | Suche | Aktualisierungen | Downloads | Hilfe
A: Fachverband Atomphysik
A 28: Poster: Interaction with VUV and X-ray light II
A 28.5: Poster
Mittwoch, 25. März 2015, 17:00–19:00, C/Foyer
Trapped highly charged ions at ultrabrilliant light sources — •Sven Bernitt1,2, René Steinbrügge1, Jan Rudolph1,3, Sascha Epp4, and José Ramón Crespo López-Urrutia1 — 1Max-Planck-Institut für Kernphysik, Heidelberg, Deutschland — 2IOQ, Friedrich-Schiller-Universität, Jena, Deutschland — 3IAMP, Justus-Liebig-Universität, Gießen, Deutschland — 4Max-Planck-Institut für Struktur und Dynamik der Materie, Hamburg, Deutschland
The properties of many astrophysical objects are determined by the interaction of highly charged ions with VUV and X-ray radiation. The newest generation of ultrabrilliant light sources -- synchrotrons and free-electron lasers -- in combination with high-resolution monochromators, allows to directly study those interactions.
In the experiments presented, the transportable electron beam ion trap FLASH-EBIT was used to provide targets of trapped highly charged ions for the synchrotrons BESSY II and PETRA III, as well as the free-electron lasers FLASH and LCLS.
By observing resonantly excited fluorescence and ion charge state changes, induced by resonant photoionization, we were able to measure precise wavelengths, line widths, and branching ratios. This provides valuable data for the interpretation of spectra from astrophysical and laboratory plasmas. Furthermore, by studying high-Z few-electron systems, we can benchmark atomic theory on the level of QED contributions.