Wuppertal 2015 – wissenschaftliches Programm
AKBP 12.5: Vortrag
Donnerstag, 12. März 2015, 14:45–15:00, BZ.08.06 (HS 1)
Beam Induced Fluorescence (BIF) monitor development — •Yulia Shutko1, Dieter Hoffmann1, Peter Forck2,3, Beata Walasek-Höhne2, Thomas Sieber2, and Serban Udrea3 — 1Technische Universität Darmstadt, Darmstadt, Germany — 2GSI Helmholtzzentrum für Schwerionenforschung GmbH, Darmstadt, Germany — 3Goethe-Universität Frankfurt am Main, Frankfurt am Main, Germany
The development of non-interceptive beam diagnostic methods is of high relevance for the future FAIR accelerator facilities to be built at the GSI. One of these methods is based on Beam Induced Fluorescence (BIF), which is under development at the GSI accelerators. BIF based monitors are already in operation at the GSI's LINAC since some years. Further BIF-monitor development is required for applying this method to high energy beams, as those to be delivered by FAIR's SIS-100 synchrotron. For this purpose beam profile and spectroscopic investigations with Nitrogen and Argon in a pressure range from 1e-3 to 1 mbar with heavy ion beams at energies between 100 and 900 MeV/u have been performed. The results concerning image reproduction and emission spectra will be presented in this contribution.