Hannover 2016 – wissenschaftliches Programm
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A: Fachverband Atomphysik
A 7: Highly charged ions and their applications
A 7.4: Hauptvortrag
Montag, 29. Februar 2016, 15:30–16:00, f107
X–ray emission from highly charged ions — •Andrey Surzhykov1, Stephan Fritzsche1,2, Andrey Volotka1, Vladimir Yerokhin3, and Thomas Stöhlker1,2 — 1Helmholtz-Institut Jena, Germany — 2Universität Jena, Germany — 3St. Petersburg Polytechnical University, Russia
With the recent advents of coherent light sources and ion traps, new possibilities arise to study the electronic structure of simple atomic systems in strong nuclear fields. The information about this electronic structure is usually obtained from the analysis of photon emission from highly charged ions. During the last decade, a large number of experiments have been performed to observe x–rays emitted in the course of characteristic bound–state transitions and elastic light scattering. To understand the outcome of these measurements, detailed theoretical investigations of the structure of highly charged ions and of their coupling to the electromagnetic field are needed. In our contribution, therefore, we present an overview of recent theoretical advances in the treatment of interaction of few–electron ions with light. We will pay special attention to the second–order QED processes such as two–photon transitions and elastic (Rayleigh) x–ray scattering. The analysis of these processes requires the knowledge about the complete Dirac spectrum of many–electron ions as represented either by Green’s function or by B–spline basis sets. After a short discussion of both theoretical approaches, we will present and discuss calculations for the two–photon decay of beryllium–like ions as well as of elastic x–ray scattering by closed–shell medium– and high–Z systems.