Regensburg 2016 – wissenschaftliches Programm
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DF: Fachverband Dielektrische Festkörper
DF 7: Focus Session: Ferroic Domain Walls I
DF 7.2: Vortrag
Dienstag, 8. März 2016, 10:10–10:30, H25
Roughness, dynamics and conduction at domain walls in Pb(Zr0.2Ti0.8)O3 thin films — •Philippe Tückmantel1, Iaroslav Gaponenko1, Benedikt Ziegler1, Joshua Agar2, Lane Martin2, and Patrycja Paruch1 — 1DQMP, University of Geneva — 2MSE, University of Berkeley
Defects and electrostatic boundary conditions greatly impact the geometry and growth dynamics of polarization domains in ferroelectric thin films. In PZT we have shown that defect pinning and screening by surface water determine the roughness and creep dynamics of 180∘ domain walls. Surface adsorbates and defects can also reversibly control domain wall conduction. However, there has not been a detailed study considering specifically the interrelation of domain wall roughness and local conductance variations.
Here, we present our results on PZT thin films grown simultaneously on STO, DSO, GSO, and LSAT substrates to address this. Substrate choice provides control over the defect density, while ultra-high vacuum (UHV) thermal annealing allows removal of surface adsorbates, thus providing an opportunity to study the role of defects and adsorbates on the functional and fundamental ferroelectric domain walls.
Using piezoresponse force microscopy at ambient conditions as well as in UHV, we study the effect of the substrate and surface adsorbates on the roughness and growth dynamics of domains as well as on the conduction behaviour of the domain walls, thus providing insight into the effect of the substrate on the intrinsic defect configuration of the overlying films.