Regensburg 2016 – wissenschaftliches Programm

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DS: Fachverband Dünne Schichten

DS 12: Postersession DS

DS 12.11: Poster

Montag, 7. März 2016, 17:00–19:00, Poster A

Towards Imaging of Defects in Diamond by High-Resolution TEM — •Robert Leiter1, Haoyuan Qi1, Johannes Biskupek1, Boris Naydenov2, Fedor Jelezko2, and Ute Kaiser11Electron Microscopy Group of Materials Science, University of Ulm, Albert-Einstein Allee 11, 89081 Ulm, Germany — 2Institute for Quantum Optics, University of Ulm, Albert-Einstein Allee 11, 89081 Ulm, Germany

Nitrogen-vacancy (NV), Silicon-vacancy (SiV) and other colour centres in diamond have been of rising interest in recent years due to their potential applications, such as quantum information processing[1] and fluorescent labelling in biology. For biological applications, NV and SiV centres can be created in nanodiamonds with sizes down to less than 10 nm[2,3]. Although structural characterisation of NV-centres has been done by optical and magnetic resonance methods, structure of other colour centres often remain uncovered. By using aberration-corrected high-resolution transmission electron microscopy (HRTEM), atomic resolution can be achieved. However, the imaging conditions necessary to directly image the structure of an SiV, GeV and other new centres remain unclear. Here we explore the imaging conditions that are suitable for this problem by means of image simulations and subsequent testing using an FEI TITAN image-side aberration corrected TEM operated at 80 kV and 300 kV.

[1] F. Jelezko & J. Wachtrup, phys. stat. sol. a 203, 3207-3225 (2006)

[2] J. Tisler et al., ACS Nano 3, 1959-1965 (2009)

[3] I. Vlasov et al., Nature Nanotechnology 9, 54-58 (2014)

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