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MA: Fachverband Magnetismus
MA 46: Magnetic Measurement Methods
MA 46.11: Talk
Thursday, March 10, 2016, 18:15–18:30, H33
Identical wavelength-dependent magnetooptical response of ultrathin permalloy films in multilayer structures on different substrates — Rajkumar Patra1, Danilo Bürger1, Roland Mattheis2, Hartmut Stöcker3, Fangbin Han4, Bin Peng4, Wenxu Zhang4, Manuel Monecke5, Georgeta Salvan5, Stefan Pofahl6, Rudolf Schäfer6, Oliver G. Schmidt1,7, and •Heidemarie Schmidt1 — 1Fakultät ETIT, TU Chemnitz — 2IPHT Jena — 3TU BA Freiberg — 4UESTC, China — 5Fakultät Physik, TU Chemnitz — 6Metallic Materials, IFW Dresden — 7Integrative Nanosciences, IFW Dresden
The multilayer systems discussed in this work consist of Ru/permalloy (Py)/Ta stacks on different substrates, namely SiO2/Si and ZnO. The wavelength-dependent on-diagonal elements of the dielectric tensors of all layers in the multilayer systems have been determined from standard ellipsometry measurements and modelling. Below Curie temperature, the wavelength-dependent off-diagonal elements of the dielectric tensor of the Py films are non-zero and odd functions of magnetization. Therefore, we applied vector magnetooptical generalized ellipsometry with a 0.4 T octupole magnet [1] to study the optical anisotropy of the multilayer structures and employed the 4x4 matrix algorithm to characterize the directly measured 4x4 Mueller matrix and to extract the thickness-independent dielectric tensor [2] of the Py thin films. [1] K. Mok, N. Du, H. Schmidt, Rev. Sci. Instr. 82 (2011) 033112; [2] K. Mok, H. Schmidt et al. J. Appl. Phys. 110 (2011) 123110; Phys. Rev. B 84 (2011) 094413