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MA: Fachverband Magnetismus
MA 46: Magnetic Measurement Methods
MA 46.5: Talk
Thursday, March 10, 2016, 16:30–16:45, H33
Magnetic force microscopy sensors based on nanowire mechanical resonators — •Thomas Mühl1, Christopher F. Reiche1, Julia Körner1, Clemens Gütter1, and Bernd Büchner1, 2 — 1Leibniz-Institut für Festkörper- und Werkstoffforschung IFW Dresden — 2Institut für Festkörperphysik, Technische Universität Dresden
Magnetic force microscopy (MFM) employing monopole-type probes allows for quantitative measurements of derivatives in space of magnetic field components. Furthermore, the concept of bidirectional MFM enables a direct, fast, and quantitative real space mapping of field component derivatives in both the perpendicular and a lateral direction [1, 2]. It relies solely on multiple-mode flexural cantilever oscillations.
Here, we present a new quantitative approach that enables the mapping of one component of the magnetic stray field in real space. This technique is based on the integration of field derivative maps measured at different scan heights. Furthermore, we combine the ease-of-detection and stability of standard cantilevers with the high sensitivity of nanowire mechanical resonators by applying our recently developed co-resonant sensor concept [3] to MFM. The basis of our MFM probes are iron-filled carbon nanotubes that constitute both nanoscale mechanical resonators and monopole-type magnetic probes.
[1] T. Mühl et al., Appl. Phys. Lett. 101, 112401 (2012).
[2] C. F. Reiche et al., New J. Phys. 17, 013014 (2015).
[3] C. F. Reiche et al., Nanotechnology 26, 335501 (2015).