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MI: Fachverband Mikrosonden

MI 3: X-ray Imaging, Holography, Ptychography and Tomography

Mittwoch, 9. März 2016, 10:00–12:30, H5

10:00 MI 3.1 Hauptvortrag: Laboratory-based X-ray microscopy - Technique and applications — •Ehrenfried Zschech, Jürgen Gluch, Sven Niese, Kristina Kutukova, and Qiong Li
10:45 MI 3.2 Scanning X-Ray Microscopy of Superconductor/Ferromagnet Bilayers — •Claudia Stahl, Stephen Ruoß, Markus Weigand, Patrick Zahn, Jonas Bayer, Gisela Schütz, and Joachim Albrecht
11:00 MI 3.3 Efficiency simulation and measurements for MZP hard X-ray nanofocusing and imaging — •Jakob Soltau, Christian Eberl, Tim Salditt, Hans-Ulrich Krebs, and Markus Osterhoff
11:15 MI 3.4 Multi plane probe retrieval in X-ray nearfield imaging — •Johannes Hagemann and Tim Salditt
  11:30 Coffee break (15 min)
11:45 MI 3.5 Holography-guided ptychography with soft X-rays — •Piet Hessing, Bastian Pfau, Erik Guehrs, Michael Schneider, Laura Shemilt, Jan Geilhufe, and Stefan Eisebitt
12:00 MI 3.6 Polarization contrast of nanoscale waveguides studied by coherent diffractive imaging with high-harmonic source — •Sergey Zayko, Murat Sivis, Sascha Schäfer, and Claus Ropers
12:15 MI 3.7 Phase-Contrast Tomography with Anisotropic X-Ray Sources — •Malte Vassholz and Tim Salditt
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DPG-Physik > DPG-Verhandlungen > 2016 > Regensburg