MM 40: Topical session: In-situ Microscopy with Electrons, X-Rays and Scanning Probes in Materials Science IV - Atomic structure and defects III
Mittwoch, 9. März 2016, 15:45–18:00, H38
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15:45 |
MM 40.1 |
Topical Talk:
Mapping local transient strain fields during in situ TEM deformation — •Christoph Gammer
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16:15 |
MM 40.2 |
In-situ TEM isothermal annealing of nano-crystalline supersaturated Cu-Cr thin film alloys — •Tristan Harzer, Jazmin Duarte, and Gerhard Dehm
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16:30 |
MM 40.3 |
Fracture toughness of freestanding gold thin films studied by bulge testing — •Eva Preiß, Benoit Merle, and Mathias Göken
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16:45 |
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15 min. coffee break
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17:00 |
MM 40.4 |
Nanostructured Metallic Glasses: Tailoring the Mechanical Properties of Amorphous Metals — •Karsten Albe, Tobias Brink, and Omar Adjaoud
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17:30 |
MM 40.5 |
Medium range order in Pd-based glasses — •Vitalij Schmidt, Harald Rösner, Martin Peterlechner, Gerhard Wilde, and Paul Vayles
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17:45 |
MM 40.6 |
Analysis of local atomic arrangement in layered Ge-Sb-Te crystal structures by advanced scanning transmission electron microscopy — •Andriy Lotnyk, Ulrich Ross, Sabine Bernütz, Erik Thelander, and Bernd Rauschenbach
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