Regensburg 2016 – wissenschaftliches Programm

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O: Fachverband Oberflächenphysik

O 44: Graphene: Electronic Properties, Structure and Substrate Interaction

O 44.7: Poster

Dienstag, 8. März 2016, 18:15–20:30, Poster E

Flipping ripples of freestanding graphene membranes using Scanning Tunneling Microscopy — •Bernd Uder, Wolf-Rüdiger Hannes, and Uwe Hartmann — Fachrichtung Experimentalphysik, Universität des Saarlandes, Germany

Measurement and control of the elastic properties of two-dimensional materials is a prerequisite for their development into nanoelectromechanical systems. So far atomic force microscopy has been the only tool used to determine elastic moduli and breaking strength of freestanding graphene membranes [1]. This method usually does not allow a thorough characterization in terms of defect concentration and other sample parameters. Here we report on the deformation of graphene membranes using the attractive forces of a scanning tunneling microscope tip. The method poses challenges since membrane and tip instabilities are easily induced. We have been able to initiate flipping processes, which are reversible but show a hysteresis. Cascade like flipping and metastable membrane states are also observed. Possible relations with local elastic properties of the rippled membrane structure are discussed within a simple model.

[1] C. Lee, X. Wei, J. W. Kysar, J. Hone, Science 321, 385 (2008)