Regensburg 2016 – wissenschaftliches Programm

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O: Fachverband Oberflächenphysik

O 82: Structure of Solid/Liquid Interfaces I

O 82.5: Vortrag

Donnerstag, 10. März 2016, 11:30–11:45, H6

Quantitative Measurements of Electrochemical Strain using Atomic Force Microscopy — •Valon Lushta^1,2, Thomas Göddenhenrich¹, Bernhard Roling², and André Schirmeisen¹ — ¹Institut für Angewandte Physik, Justus-Liebig-Universität Gießen, D-35392 Gießen — ²Physikalische Chemie,Philipps-MarburgUniversität Marburg, D-35032 Marburg

Electrochemical Strain Microscopy (ESM) has emerged as a powerful tool for probing ionic transport in battery cathode. A biased AFM tip concentrates an electric field in a nanometer-scale volume of the sample, inducing ionic intercalation or deintercalation. The intrinsic link between concentration of ionic species and the molar volume of the material results in electrochemical strain and surface displacement. The magnitude of this displacement is lower than the sensitivity of modern AFMs. The excitation signal at the tip is chosen at contact resonance frequency in order to amplify the displacement by the Q factor of the AFM cantilever. The ongoing challenges in ESM are the quantitative measurement of the displacement and understanding delocalized electrostatic forces effecting the cantilever motion. Both challenges are linked to the uncertainty of contact resonance dynamics. We demonstrate a technique to quantify the displacement and estimate the electrostatic contribution without loss of resonance amplification.