Regensburg 2016 – wissenschaftliches Programm
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O: Fachverband Oberflächenphysik
O 9: Nanostructures at Surfaces I
O 9.4: Vortrag
Montag, 7. März 2016, 11:15–11:30, H6
Correlation of scanning x-ray microscopy and HRTEM measurements of carbon nanomaterials — •Fabian Fritz1,2, Rasmus Westerström3, Lothar Houben4, Martina Luysberg4, Alexey A. Popov5, Claus M. Schneider2, and Carola Meyer1 — 1Fachbereich Physik, Universität Osnabrück, Germany — 2Peter Grünberg Institut (PGI-6), Forschungszentrum Jülich GmbH, Germany — 3Physik-Institut, Universität Zürich, Switzerland — 4Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons, Forschungszentrum Jülich GmbH, Germany — 5Leibniz Institute for Solid State and Materials Research (IFW), Dresden, Germany
High resolution transmission electron microscopy (HRTEM) is often used to study the structure of nanomaterials. Scanning transmission x-ray microscopy (STXM) is a synchrotron based nano-spectroscopy technique for recording nano-scaled images with chemical and magnetic contrast.
Here we present a combined HRTEM and STXM study of carbon nanotube (CNT) bundles filled with Er3N@C80 fullerenes. The measurements demonstrate that unique CNT bundles can be located and studied with the two techniques. We also obtained erbium M5 edge x-ray absorption spectra from a single bundle. Images recorded on and off resonance provide an erbium map of the sample.
We correlate HRTEM and STXM images of the same nanometer scaled object and discuss the combination of the two techniques.