Regensburg 2016 – wissenschaftliches Programm

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VA: Fachverband Vakuumphysik und Vakuumtechnik

VA 2: Vacuum Physics

VA 2.2: Vortrag

Montag, 7. März 2016, 11:15–11:45, H25

Dynamic-XPS measurements by means of new Fast-XPS end-station based on Argus spectrometer at PETRA III — •Sergey Babenkov¹, Victor Aristov^1,2,3, Olga Molodtsova^1,4, Frank Scholz¹, Joern Seltmann¹, Ivan Shevchuk¹, Leif Glaser¹, and Jens Viefhaus¹ — ¹DESY, Hamburg, Germany — ²ISSP RAS, Chernogolovka, Russia — ³TU Bergakademie, Freiberg, Germany — ⁴ITMO, Saint Petersburg, Russia

The experimental setup, based on a hemispherical electron spectrometer Argus (Omicron NanoTechnology GmbH), has been built up, commissioned and currently is available for regular users of PETRA III. The setup allows acquiring both traditional scanning and extremely fast snapshot (down to 0.1 sec/spectrum) XPS spectra of several core levels (CL). It opens new possibilities to real time characterization of the fast processes from quantitative and qualitative point of view by dynamical measuring of XPS. The concept was verified by real time XPS characterization of thermally induced process of graphene formation on model cubic-SiC(001)/Si(001) wafer. Moreover, we present the dynamic-XPS study of controllable metal-organic interface formation (Indium/CuPcF4) at room temperature conditions. This work was supported by grants of RFBR No 13-02-00818, 14-02-00949, BMBF-Project No. 05K12GU2, PSP-Element No. U4606BMB1211.