Dresden 2017 – wissenschaftliches Programm
CPP 35.1: Vortrag
Mittwoch, 22. März 2017, 10:15–10:30, ZEU 222
Characterization of polymer crystallization in conducting thin films using grazing incidence x-ray scattering — Stephan Pröller1, Jenny Lebert1, Mihael Coric1, Peter Müller-Buschbaum2, Alexander Hexemer3, and •Eva M. Herzig1 — 1TU München, Munich School of Engineering, Herzig Group, 85748 Garching, Germany — 2TU München, Physik-Department, LS Funktionelle Materialien, 85748 Garching, Germany — 3Lawrence Berkeley National Laboratory, Advanced Light Source, Berkeley, USA
The material properties of conducting thin films are - like for many other material systems - closely linked to the nanoscale order and disorder of the involved polymers. Therefore it is important to have adequate experimental methods allowing the characterization of crystallization and aggregation of polymers in thin films, and ideally also during thin film formation. Grazing incidence wide angle x-ray scattering is more and more frequently used to examine the nanoscale order in thin films. Using examples of model systems and novel materials studied in our group the capabilities and limitations of this method are demonstrated.