Dresden 2017 – wissenschaftliches Programm
CPP 55.2: Hauptvortrag
Donnerstag, 23. März 2017, 10:45–11:15, ZEU 222
Mapping of trap densities and contact resistance in organic devices and their relation to structural disorder — •Bert Nickel1, Clemens Liewald1, Simone Strohmair1, Eric Glowacki2, and Andrey Turchanin3 — 1Ludwig-Maximilians-Universität, Department of physics & CeNS, D-80539 Munich, Germany — 2Linköpings Universitet, Laboratory of Organic Electronics, SE-601 74 Norrköping, Sweden — 3Friedrich-Schiller-Universität Jena, Institute of Physical Chemistry, 07743 Jena, Germany
We develop experimental tools to explore the influence of static and dynamical disorder phenomena on transport in organic devices. Examples studied range from simple aromatics such as pentacene and DNTT to H-bonded pigments such as epindolidione. We aim on correlating the electronic transport properties  with local structural properties obtained from nano beam x-ray diffraction experiments and near field microscopy . Photocurrent microscopy allows us to determine local transport properties such as trap densities and charge carrier dynamics in fully operational thin film transistors, as well as local distribution of contact resistances. Contact resistance is often related to imperfect growth on metal contacts, we will present new approaches to deposit highly ordered films by transfer techniques.
 C. Liewald, D. Reiser, B. Nickel, Applied Physics Letters 109, p53301 (2016)
 C. Westermeier, A. Cernescu, S. Amarie, C. Liewald, F. Keilmann, B. Nickel, Nature Communications 5, Article Number 4101 (2014)