Dresden 2017 – scientific programme
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CPP: Fachverband Chemische Physik und Polymerphysik
CPP 70: Organic Electronics and Photovoltaics V: OPV (joint session CPP/DS/HL, organized by CPP)
CPP 70.10: Talk
Friday, March 24, 2017, 13:00–13:15, ZEU 255
Procedures and Practices for Evaluating Thin-Film Solar Cell Stability — •Roland Rösch1, Tobias Faber1, Monica Lira-Cantu2, Elizabeth von Hauff3, Thomas Brown4, and Harald Hoppe1 — 1CEEC Jena, FSU Jena — 2ICN2, Barcelona — 3Vrije Universiteit Amsterdam — 4University of Rome "Tor Vergata"
Novel thin film PV technologies require an attestation of their stability in order to get ready for their qualification. In order to improve the understanding of degradation effects and how they can be prevented, stress testing under different conditions is commonly applied. By careful combination of stress factors and thorough analysis of photovoltaic parameter decaying curves, an understanding of the underlying degradation pathways can be gained. With the help of standardized and accelerated stress tests, as described in the ISOS-protocols [1], statements concerning application lifetimes can finally be made and compared among different labs. Once a photovoltaic technology has proven long lasting durability, the ultimate barrier for entering the commercial market are the IEC tests, taking a deeper look on overall safety and reliability, not only on durability. Here, the most prominent stress tests are reviewed, discussed and extended with respect to learning the most about photovoltaic device stability [2]. The most prominent outcome of this discussion an analytical determination of the *burn-in* time (tS) and furthermore the operational lifetime (tS80) and the lifetime energy yield (LEY), a newly introduced figure of merit as a measure for the energy a solar cell can produce during its lifetime. [1] Reese, SOLMAT, 95 (2011) 1253-1267 [2] Roesch, AEM, 5 (2015) 1501407