Dresden 2017 – wissenschaftliches Programm

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DS: Fachverband Dünne Schichten

DS 21: Thin Film Characterisation: Structure Analysis and Composition II

Dienstag, 21. März 2017, 09:30–13:00, CHE 91

09:30 DS 21.1 Analysis of domain formation of epitaxial chalcogenide thin films — •Marc Pohlmann, Marvin Kaminski, Matti Wirtssohn, Abderaffi Moktad, Oana Cojocaru-Mirédin, Peter Jost, and Matthias Wuttig
09:45 DS 21.2 Growth and characterization of VO2 thin films deposited on various perovskite and complex oxides single crystal substrates — •Adrian Petraru, Gabriel Bello Waldschütz, Ravi Droopad, and Hermann Kohlstedt
10:00 DS 21.3 Microstructural properties of Ti2AlN MAX-Phase thin films, synthesized by multilayer PVD techniques — •Lukas Gröner, Eduart Reisacher, Eberhard Nold, Alexander Fromm, Frank Meyer, Chris Eberl, and Frank Burmeister
10:15 DS 21.4 Characteristic Diffuse Scattering from Rough Lamellar Gratings — •Analia Fernandez Herrero, Victor Soltwisch, Mika Pflüger, Jürgen Probst, and Frank Scholze
10:30 DS 21.5 Structure-property relationships in catalysts identified by combining data science and high-throughput experimentation — •Helge S. Stein, Jinjang Li, Ramona Gutkowski, Christina Eberling, Sally Jiao, Kirill Sliozberg, Christoph Schwanke, Karin M. Aziz-Lange, Lifei Xi, Andre D. Taylor, Wolfgang Schuhmann, and Alfred Ludwig
10:45 DS 21.6 Combining human and algorithmic analysis for the rapid identification of phase regions and crystal structures — •Helge S. Stein, Sally Jiao, and ALFRED Ludwig
11:00 DS 21.7 Analysis of surface oxidation of TiON ALD filmsJustyna Łobaza, •Małgorzata Kot, and Dieter Schmeißer
  11:15 15 min. break.
11:30 DS 21.8 Interfacial oxide formation during ALD oxide growth on reactive metals for resistive switching devices — •Stephan Aussen, Alexander Hardtdegen, Katharina Skaja, Regina Dittmann, and Susanne Hoffmann-Eifert
11:45 DS 21.9 Analytical Electron Microscopy Study to Resolve the Phase Morphology of Organic Solar Cell Blends — •Mona Sedighi, Falk Röder, Markus Löffler, Petr Formanek, and Ehrenfried Zschech
12:00 DS 21.10 Quantitative Raman spectroscopy of doped and undoped multiphase TiO2 thin films on complex substrates — •Sebastian Schipporeit, Dieter Mergel, and Volker Buck
12:15 DS 21.11 Improved XPS Background Fitting with a Modified Tougaard Universal Cross Section Using the Example of Aluminium — •Manuel Monecke, Georgeta Salvan, and Dietrich R.T. Zahn
  12:30 DS 21.12 Der Beitrag wurde abgesagt.
12:45 DS 21.13 Investigation of molecular orientation in individual metal-organic nanowire by polarized Raman spectroscopy and simulation — •Yanlong Xing, Eugen Speiser, Dheeraj Singh, Petra Dittrich, and Norbert Esser
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