Dresden 2017 – wissenschaftliches Programm
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DS: Fachverband Dünne Schichten
DS 3: Thin Film Characterisation: Structure Analysis and Composition I
DS 3.13: Vortrag
Montag, 20. März 2017, 12:45–13:00, CHE 91
The effect of substrate miscut in epitaxial PMN-PT thin films — •Paul Chekhonin1,3, Michael Mietschke1,2, Darius Pohl1, Frank Schmidt1,2, Sebastian Fähler1, Werner Skrotzki3, Kornelius Nielsch1,2, and Ruben Hühne1 — 1Institute for Metallic Materials, IFW Dresden — 2Institut für Werkstoffwissenschaft, Technische Universität Dresden — 3Institut für Strukturphysik, Technische Universität Dresden
The perovskite (1-x)Pb(Mg1/3Nb2/3)O3-xPbTiO3 (or (1-x)PMN-xPT) exhibits excellent ferroelectric and electrocaloric properties. The use of epitaxial films of PMN-PT facilitates the analysis of predetermined crystal orientations and the application of strain. Therefore, PMN-PT thin films were grown on SrTiO3 (STO) substrates using pulsed laser deposition. In comparison to standard (001) oriented substrates, such with a certain miscut allow the growth in a much broader parameter range. To advance the understanding of the substrate miscut, the microstructure of 0.68PMN-0.32PT thin films grown on La0.7Sr0.3CoO3 buffered STO substrates, with and without miscut, is compared in detail applying X-ray diffraction and high resolution transmission electron microscopy. The PMN-PT layers in both cases exhibit strain relaxation. While in the film without miscut perfect misfit dislocations are observed, in the film with miscut partial dislocations and stacking faults dominate the microstructure. These results may be useful to comprehend the stabilisation of the perovskite PMN-PT phase on miscut substrates.