Dresden 2017 – wissenschaftliches Programm
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DS: Fachverband Dünne Schichten
DS 35: 2D Materials Beyond Graphene IV (jointly with O)
DS 35.8: Vortrag
Mittwoch, 22. März 2017, 17:00–17:15, WIL A317
MoS2 film conductivity change on periodically poled LiNbO3 substrate determined by nano-FTIR spectroscopy — •Piotr Patoka1, Georg Ulrich1, Peter Hermann2, Bernd Kästner2, Ariana Nguyen3, Arne Hoehl2, Ludwig Bartels3, Peter Dowben4, Gerhard Ulm2, and Eckart Rühl1 — 1Physikalische Chemie, Freie Universität Berlin, Takustr. 3, 14195 Berlin, Germany — 2Physikalisch-Technische Bundesanstalt (PTB), Abbestr. 2-12, Berlin, 10587, Berlin, Germany — 3Dept. of Chemistry, Univ. of California Riverside, Riverside, CA 92521, USA — 4Dept. of Physics and Astronomy, Univ. of Nebraska, Lincoln, Lincoln, NE 68588-0299 USA
Coupling of ultra-broadband synchrotron radiation from the Metrology Light Source (MLS) to a scattering-type scanning near-field optical microscope (s-SNOM) allows for contactless conductivity evaluation in the mid-infrared regime. The system is based on an atomic force microscope, such that the optical signal can be directly correlated with topographic information. Using this method, we investigated the influence of a ferroelectric substrate (LiNbO3) enhanced by its surface phonon on thin films of MoS2. Recent electric transport measurements suggest changes in the carrier density due to substrate polarization.[1] The present findings obtained from s-SNOM studies offer a complimentary way of contactless investigations of conductivity changes.[2]
[1] Nguyen, A. et al., Nano Lett. 15, 3364-3369 (2015).
[2] Hermann, P. et al., Opt. Express 21, 2913-2919 (2013).