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DS: Fachverband Dünne Schichten
DS 44: Postersession II
DS 44.28: Poster
Thursday, March 23, 2017, 17:00–19:00, P1C
The novel Kiel high flux X-ray diffractometer for heavy loads and with focusing option — •Finn Christiansen, Jochim Stettner, and Olaf Magnussen — Institut für experimentelle und angewandte Physik Kiel, Univerversität Kiel
We present a novel X-ray diffractometer, installed at the Kiel rotating anode microfocus X-ray lab source, which is characterized by a flexible and massive design of all components and high X-ray flux. The instrument is especially dedicated for in-situ investigations of solid surfaces, solid-solid and liquid-solid interfaces in complex sample environments (e.g. vacuum and plasma chambers up to 250 kg). Additionally, the diffractometer provides a vertical focusing option for spatially resolved measurements, microcrstals and measurements under grazing incidence with enhanced flux on the sample.
Two different modes are available: In the "high flux mode" a Multilayer Montel mirror provides a vertically and horizontally collimated beam with a diameter of ≈2 mm with 4.3 · 108 Ph/s. The white beam background and CuKβ contributions are strongly suppressed. In the "vertical focusing mode", an additional multilayer mirror, located close to the sample, reduces the spot size at the sample position to 2(h) x 0.1(v) mm2.
Key parameters for both operational modes like flux, resolution and spot size at the sample position were determined quantitatively. Additionally, we present first X-ray data of model systems, e.g. ZnO surfaces and microcrystals in order to demonstrate the performance of this instrument.