Dresden 2017 – wissenschaftliches Programm

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HL: Fachverband Halbleiterphysik

HL 88: Organic Electronics and Photovoltaics V: OPV

HL 88.10: Vortrag

Freitag, 24. März 2017, 13:00–13:15, ZEU 255

Procedures and Practices for Evaluating Thin-Film Solar Cell Stability — •Roland Rösch¹, Tobias Faber¹, Monica Lira-Cantu², Elizabeth von Hauff³, Thomas Brown⁴, and Harald Hoppe¹ — ¹CEEC Jena, FSU Jena — ²ICN2, Barcelona — ³Vrije Universiteit Amsterdam — ⁴University of Rome "Tor Vergata"

Novel thin film PV technologies require an attestation of their stability in order to get ready for their qualification. In order to improve the understanding of degradation effects and how they can be prevented, stress testing under different conditions is commonly applied. By careful combination of stress factors and thorough analysis of photovoltaic parameter decaying curves, an understanding of the underlying degradation pathways can be gained. With the help of standardized and accelerated stress tests, as described in the ISOS-protocols [1], statements concerning application lifetimes can finally be made and compared among different labs. Once a photovoltaic technology has proven long lasting durability, the ultimate barrier for entering the commercial market are the IEC tests, taking a deeper look on overall safety and reliability, not only on durability. Here, the most prominent stress tests are reviewed, discussed and extended with respect to learning the most about photovoltaic device stability [2]. The most prominent outcome of this discussion an analytical determination of the *burn-in* time (tS) and furthermore the operational lifetime (tS80) and the lifetime energy yield (LEY), a newly introduced figure of merit as a measure for the energy a solar cell can produce during its lifetime. [1] Reese, SOLMAT, 95 (2011) 1253-1267 [2] Roesch, AEM, 5 (2015) 1501407