Dresden 2017 – wissenschaftliches Programm
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KR: Fachgruppe Kristallographie
KR 2: X-Ray Imaging, Holography, Ptychography and Tomography (with MI)
KR 2.2: Vortrag
Mittwoch, 22. März 2017, 10:00–10:15, MER 02
Imaging with hard X-rays and Nanometer Resolution using Multilayer Zone Plates — •Jakob Soltau1, Christian Eberl2, Tim Salditt1, Hans-Ulrich Krebs2, and Markus Osterhoff1 — 1Röntgenphysik, Uni-Göttingen, Friedrich-Hund Platz 1, 37077 Göttingen — 2Materialphysik, Uni-Göttingen, Friedrich-Hund Platz 1, 37077 Göttingen
The resolution of zone plates is determined by their smallest zone width. Multilayer zone plates (MZP) can be fabricated using the process of pulsed laser deposition, which allows zone width of 5 nm and less and therefore enabling imaging of X-rays on a nanometer scale [1]. The central challenge in the development of hard X-ray nano-focusing MZPs is the fulfilling of the Bragg condition across the zone plate. To achieve this the individual zones need to be tilted. Latest experiments using tilted-MZPs at synchrotron sources demonstrated successfully a resolution of a few nanometer in a wide X-ray energy range from 7 keV at DESY/Petra III and for the first time with photon energies above 100 keV at ESRF. A new setup and a motorized stage significantly reduced the set-up and measuring time in scanning X-ray microscopy allowing high resolution imaging of soft- and hard-matter samples in a shorter time. In addition to the experiments, 3D simulations have been performed. The propagation of electromagnetic waves inside and behind the MZP proved the advantage of circular MZPs to achieve very high photon flux densities in a single focal point. The simulations were revealing interaction processes like e.g. dynamical diffraction inside the MZPs. [1] Eberl, C. et al. Appl. Surf. Sc