Dresden 2017 – wissenschaftliches Programm
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MI: Fachverband Mikrosonden
MI 7: Poster: Microanalysis and Microscopy
MI 7.12: Poster
Mittwoch, 22. März 2017, 18:00–20:00, P4
X-ray crystallography study of Cu-Ga sputter target alloys for Cu(In,Ga)Se2 thin film solar cells by means of Kossel microdiffraction in the SEM — •Tijani Dmali1,2, Enrico Langer1,2, and Siegfried Däbritz1 — 1Technische Universität Dresden, Institut für Festkörperphysik, 01069 Dresden — 2Technische Universität Dresden, Institut für Halbleiter- und Mikrosystemtechnik, 01187 Dresden
Investigation results on polycrystalline Cu-Ga sputter targets by X-ray Kossel microdiffraction will be presented. Materials of this binary system are used for Copper Indium Gallium Diselenide thin film solar cells. The examined specimens are alloys with varied matrix compositions, which has been manufactured by different methods. The observed microstructures showed to be an eutectic phase in this Gallium concentration range. In each case the first X-ray Kossel microdiffraction analyses by means of a CCD area detector proved the existence of an hexagonal close packed lattice, contrary to other measurements and the Cu-Ga phase diagram in certain Ga concentration ranges. The lattice parameters a and c as well as their variation were precisely measured in the micro range. Interestingly in both limiting cases of the lattice constant a the ratio c/a is exactly c/a= 1.620. In combination with EDX measurements it was found that each matrix consists of the ζ phase which can be distinguished in terms of the chemical composition and lattice constants.
We are greatfull to Marian Böhling for the supply of the sample material and his suggestion to investigate this material.