Dresden 2017 – wissenschaftliches Programm

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MI: Fachverband Mikrosonden

MI 7: Poster: Microanalysis and Microscopy

MI 7.7: Poster

Mittwoch, 22. März 2017, 18:00–20:00, P4

Correlative Microscopy and Image Fusion of SIMS and Electron Microscopy data — •Florian Vollnhals, Santhana Eswara, Jean-Nicolas Audinot, David Dowsett, and Tom Wirtz — Advanced Instrumentation for Ion Nano-Analytics (AINA), Luxembourg Institute of Science and Technology (LIST), L-4422 Belvaux, Luxembourg

The investigation of complex micro- and nanostructured samples found in many fields of science like materials research, biology and medicine, pose significant challenges both in terms of microscopy and chemical microanalysis. Often, a combination of different imaging and analysis techniques is required to establish a comprehensive picture of the sample and its properties.

Correlative microscopy of high-resolution techniques like SEM or TEM with chemically sensitive techniques like imaging SIMS, can provide such information. These resulting multimodal data sets are commonly evaluated individually or side-by-side, but it is also possible to combine both types of data in a meaningful way to improve or facilitate their analysis. One such approach is derived from remote sensing, where low resolution spectral images are sharpened via a high-resolution pan-chromatic band. We will present two basic image fusion approaches (EM sharpening using IHS transformation and Laplacian pyramid based) and discuss their applicability, advantages and disadvantages in the context of TEM/SIMS, SEM/SIMS and HIM/SIMS correlative microscopy.

[1] T. Wirtz et al., Nanotechnology 26 (2015), 434001