Dresden 2017 – wissenschaftliches Programm
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O: Fachverband Oberflächenphysik
O 106: Electronic Structure of Surfaces: Spectroscopy, Surface States III
O 106.3: Vortrag
Freitag, 24. März 2017, 11:00–11:15, WIL C107
Bulk-Sensitive Band Mapping of Mo in the Tender X-ray Range — •Dmitry Vasilyev1, Katerina Medjanik1, Martin Ellguth1, Sergey Babenkov1, Anna Zaporozhchenko-Zymaková1, Christian Tusche2, Arndt Quer3, Florian Diekmann3, Sebastian Rohlf3, Matthias Kalläne3, Kai Rossnagel3, Yves Acremann4, Dmytro Kutnyakhov5, Wilfried Wurth5, Jens Viefhaus5, Hans-Joachim Elmers1, and Gerd Schönhense1 — 1Univ. Mainz — 2FZ Jülich — 3Univ. Kiel — 4ETH Zurich — 5DESY Hamburg
Recent experiments and calculations have demonstrated that ARPES can still be performed in the X-ray range [1]. Intrinsic and extrinsic effects pose limits to the performance of this new approach: the cross section drops rapidly with increasing photon energy, direct transitions are suppressed by inelastic scattering, and the photon momentum causes a sizeable shift of the emission pattern. With increasing kinetic energy the emission angles shrink so that classical ARPES reaches its limits of angular resolution, and the required energy resolution (towards 105) is at the technical limit of present instruments. Here, we demonstrate that momentum-microscopy with parallel ToF energy analysis indeed opens the range beyond soft X-rays (i.e., the tender X-ray regime) for high-resolution bulk band mapping. Sharp k-patterns with pronounced high contrast have been measured (even for fully oxidized surfaces) up to kinetic energies of 1700 eV at the high-brilliance beamline P04 (PETRA III) for the medium-Z bcc metal Mo. [1] Gray et al., Nat. Mat. 10, 759 (2011).