Dresden 2017 – wissenschaftliches Programm

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O: Fachverband Oberflächenphysik

O 63: Focus Session: Charge Transport at Surfaces and Nanostructures with Multi-probe Techniques

O 63.16: Poster

Dienstag, 21. März 2017, 18:30–20:30, P2-OG3

Recent technology advancements in SPM based electrical probing at low temperatures — •Markus Maier, J Köbele, R Thiel, A. Priou, D. Stahl, M. Fenner, and T. Roth — Scienta Omicron GmbH, Limburger Straße 75, 65232 Taunusstein, Germany

A major challenge in the development of novel devices in nano- and molecular electronics is their interconnection with larger scaled electrical circuits. Local electrical transport measurements by multiple atomic scale precision probes can significantly improve the analysis of individual nano-scaled structures without the need of a full electrical integration. The LT NANOPROBE is a sophisticated instrument that merges the requirements of a 4-probe system, efficiently and precisely navigated by a scanning electron microscope (SEM) and at the same time satisfies the needs for high performance SPM. The excellent stability in the pm range allows for atomic resolution in STM and nc-AFM (QPlus) and expands applications from electrical nano-probing towards tunnelling and force spectroscopy and even the creation of atomically precise structures. The system is operated at temperatures below 5K, specifically also during SEM operation. The microscope stage works at very low thermal drift in the range of 100pm/h. We will present measurements that prove the instrument's performance level, specifically thermal drift, stability and QPlus AFM measurements. We will also show the newest technology improvements, such as high frequency capabilities and optical access for pumped probe experiment. Future challenges as well as applications and scientific drivers for this type of scientific instrumentation will be discussed.