Dresden 2017 – wissenschaftliches Programm

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O: Fachverband Oberflächenphysik

O 70: 2D Materials Beyond Graphene III

O 70.5: Vortrag

Mittwoch, 22. März 2017, 11:30–11:45, WIL A317

Time-of-Flight Secondary Ion and Neutral Mass spectrometry of particles ejected from 3D and 2D materials during irradiation with highly charged and swift heavy ions — •Philipp Ernst1, Florian Meinerzhagen1, Matthias Herder2, Stephan Sleziona1, Andreas Wucher2, and Marika Schleberger11University Duisburg-Essen, AG Schleberger, Germany — 2University Duisburg-Essen, AG Wucher, Germany

We have studied the ionization probability for strontium titanate bombarded by energetic ions, i.e. swift heavy ions (SHI) and highly charged ions (HCI). Strontium titanate is a dielectric and as such is known to be very sensitive to both, SHI and HCI irradiation, which result in characteristic surface modifications [1,2]. Therefore, it has been postulated that both projectile types trigger similar mechanisms leading to these modifications. To test this hypothesis, we compare time-of-flight mass spectra taken during irradiation with SHI at different electronic stopping powers (dE/dx) and with HCI with varying potential energy (129Xe ions with a potential energy from Epot 4.5 up to 59 keV by constant kinetic energy Ekin), respectively. Both, emitted secondary ions (SIMS) and secondary neutrals (SNMS), were detected in order to determine differences of the ionization probability. To further test if the spatial distribution of the energy deposition (HCI a few nm, SHI up to tens of microns) does play a role, exemplary measurements with a 2D dielectric have been performed.

[1] F. Meinerzhagen, et al. Rev. Sci. Instr, 87 (2016) 013903.

[2] F. Aumayr, et al. J. Phys. Condens. Matter, 23 (39) (2011).

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