Münster 2017 – wissenschaftliches Programm
T 92.4: Vortrag
Mittwoch, 29. März 2017, 17:30–17:45, F 234
Characterization and calibration of radiation-damaged double-sided silicon strip detectors — •Levent Kaya1, Andreas Vogt1, Peter Reiter1, Benedikt Birkenbach1, Rouven Hirsch1, Christian Stahl2, and Norbert Pietralla2 — 1Institut für Kernphysik, Universität zu Köln — 2Institut für Kernphysik, Technische Universität Darmstadt
Double-sided silicon strip detectors (DSSSD) are commonly used for event-by-event identification of charged particles as well as the reconstruction of particle trajectories in nuclear physics experiments with stable and radioactive beams. Individual pixel segments are given by intersecting areas of both p- and n-doped front- and backside segments resulting in a high detector granularity. Typically, charged particles do not homogeneously illuminate the detector surface during in-beam experiments. Consequently, radiation damages of the detector are distributed non-uniformly. Position-dependent incomplete charge collection due to radiation damage limits the performance and lifetime of the detectors; the response of different channels may vary drastically. Position-resolved charge-collection losses for front- and back-side segments were investigated for an in-beam experiment and by performing radioactive source measurements. A novel position-resolved calibration method for radiation-damaged DSSSDs, based on mutual consistency of p-side and n-side charges, was developed. It yields a significant enhancement of the energy resolution and the performance of radiation-damaged parts of the detector. Supported by Bonn-Cologne Graduate School for Physics and Astronomy (BCGS).