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Münster 2017 – scientific programme

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T: Fachverband Teilchenphysik

T 92: Strahlenschäden (gemeinsam mit HK)

Wednesday, March 29, 2017, 16:45–19:00, F 234

16:45 T 92.1 Proton-energy dependent damage to Si sensors — •Elena Donegani, Eckhart Fretwurst, and Erika Garutti
17:00 T 92.2 X-ray dose and electric field dependence of oxide charges at the Si-SiO2 interface of high-ohmic Si — •Ioannis Kopsalis, Eckhart Fretwurst, Erika Garutti, Robert Klanner, and Joern Schwandt
17:15 T 92.3 Studies of radiation field impact on microstrip sensors for the CBM Silicon Tracking System — •Ievgeniia Momot, Olga Bertini, Maksym Teklishyn, Anton Lymanets, Hanna Malygina, Johann Heuser, and Christian Sturm for the CBM collaboration
17:30 T 92.4 Characterization and calibration of radiation-damaged double-sided silicon strip detectors — •Levent Kaya, Andreas Vogt, Peter Reiter, Benedikt Birkenbach, Rouven Hirsch, Christian Stahl, and Norbert Pietralla
17:45 T 92.5 Applikations- und Bestrahlungsstudien für die Wire-Bond-Enkapsulierung in zukünftigen Siliziumsensormodulen des CMS SpurdetektorsTobias Barvich, Felix Boegelsbacher, Alexander Dierlamm, •Stefan Maier und Pia Steck
18:00 T 92.6 Dark Current of Neutron Irradiated SiPMs — •Svenja Nadine Sonder, Matteo Centis Vignali, Erika Garutti, Robert Klanner, and Jörn Schwandt
18:15 T 92.7 Study of GEM ageing effects for the ALICE TPC Upgrade — •Michael Jung, Harald Appelshäuser, Chilo Garabados, and Renato Negrao de Oliveira for the ALICE collaboration
18:30 T 92.8 Radiation Tolerance of a Fully Depleted CMOS Monolithic Active Pixel Sensor — •Tobias Bus, Michael Deveaux, and Benjamin Linnik for the CBM-MVD collaboration
18:45 T 92.9 Einsatzmöglichkeiten von synthetischem Graphit in zukünfitgen SpurdetektorenTobias Barvich, Conny Beskidt, Wim de Boer, Alexander Dierlamm und •Stefan Maier
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